stuck-at fault meaning in Chinese
受干扰故障
Examples
- With the development of manufacturing technology of digital integrated circuit , the voltage test method based on stuck - at fault model can not detect all the faults in modern integrated circuit
随着集成电路制造技术的发展,基于固定型故障模型的电压测试技术越来越不能满足高性能集成电路的需求。 - In application , the test system which is established by the bst controller can test stuck - at faults , open faults and short faults on board , and gives some detail informations
在实际应用中,利用边界扫描控制器构造的测试系统能够实现对电路板的呆滞、开路和短路故障进行有效的检测和诊断,并可提供比较详细的故障诊断信息。 - The stuck - open fault is simulated concurrently using iddt testing with the test pattern pairs generated above . through detaching a pattern pair into two independent patterns , the stuck - at fault are simulated concurrently . simulation results show better fault coverage . the
最后,针对iddt测试的可行性,我们通过利用pspice软件对s208电路中的一些故障做了模拟,这些故障包括开路故障和延时故障。 - The feasibility and effectiveness of the iddt testing are both validated by experiments . at last , transistor bridging faults are simulated based on iddq testing and gate bridging faults and stuck - at faults based on voltage testing through detaching a pattern pair into two independent patterns
最后，把一个输入向量对看成两个独立的向量，分别采用稳态电流测试方法和电压测试方法模拟桥接故障的晶体管级故障和桥接故障的门级故障及固定故障。 - For the convenience of test , varied circuit chip defects caused by the production process are abstracted as all kinds of models . at present the commonly used fault models mainly consist of stuck - at fault , stuck - open fault , bridge fault , store fault , delay fault , etc . testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years . bridge fault is tested easily by quiescent power supply current ( iddq ) testing method . in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing , it can is tested by the dynamic current ( iddt ) testing
为了便于测试,我们将生产过程中集成电路出现的多种多样的缺陷抽象为各种模型。目前常用的故障模型主要有:固定故障,开路故障,桥接故障,存储故障,时滞故障等。电压测试主要针对固定型故障模型,多年的研究也取得了令人满意的结果; cmos电路中的桥接故障则宜用稳态电流测试方法( iddq )测试;对于电压和稳态电流难以测试的开路故障,可以使用瞬态电流测试( iddt )的方法进行测试。